
08: Soft X-Ray
Scattering |
OTHER DESIGNATIONS: Soft x-ray emission spectroscopy (SXES), inelastic x-ray scattering (IXS), resonant x-ray inelastic scattering (RIXS), speckle patterns, small-angle x-ray scattering (SAXS). PURPOSE: Soft x-ray scattering techniques employ the excitation of electrons in relatively shallow core energy levels (100–2000 eV) to probe the electronic structure and other properties of various kinds of matter. Problems addressed by soft x-ray spectroscopic techniques include:
HOW THE TECHNIQUE WORKS: Soft x-ray scattering is a photon-in/photon-out technique. The sample is illuminated with monochromatic soft x-rays and the scattered photons are detected over a small angular range. In the elastic scattering mode one measures the speckle diffraction pattern. In the inelastic mode the scattered photons are passed through a spectrometer and analyzed. Additional information is obtained in the resonant condition when the incident photon is near a core-level-energy absorption edge. UNIQUENESS: Each element has its own set of characteristic core-electron energies, giving these techniques their elemental specificity. The tunability of synchrotron radiation is essential. Because of the low cross sections involved, SXES and RIXS are viable only at brilliant synchrotron sources. EXAMPLES:
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